Machine vision based defect detection approach using image processing

dc.contributor.authorBaygin, Mehmet
dc.contributor.authorKarakose, Mehmet
dc.contributor.authorSarimaden, Alisan
dc.contributor.authorAkin, Erhan
dc.date.accessioned2026-08-12T16:08:31Z
dc.date.issued2017
dc.departmentFırat Üniversitesi
dc.description2017 International Artificial Intelligence and Data Processing Symposium, IDAP 2017 -- 16 September 2017 through 17 September 2017 -- Malatya -- 115012
dc.description.abstractMachine vision systems are used in industrial production areas to produce products with fast, perfect and high precision. These systems allow users to make highly accurate and non-contact measurements and can detect deficiencies in the production process. In this work, a machine vision based non-contact defect detection algorithm for printed circuit boards (PCBs) has been developed. In this approach, which detects and controls the holes on the PCB, first a reference image is taken from the system and feature extraction process is applied to this image. In this real-time working approach, the reference image is matched with the incoming test images and the missing holes on the PCB are precisely detected. Furthermore, it has been determined that the error amount is less than 2 ?M in experimental studies. This approach, which works independently of color, position and direction, enables the defect detection process to be done very quickly and precisely. © 2017 IEEE.
dc.description.sponsorshipTUBITAK, (:112D021); Türkiye Bilimsel ve Teknolojik Araştirma Kurumu, TÜBITAK, (0743)
dc.identifier.doi10.1109/IDAP.2017.8090292
dc.identifier.isbn978-153861880-6
dc.identifier.scopus2-s2.0-85039896936
dc.identifier.scopusqualityN/A
dc.identifier.urihttps://doi.org/10.1109/IDAP.2017.8090292
dc.identifier.urihttps://hdl.handle.net/11508/41268
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.ispartofIDAP 2017 - International Artificial Intelligence and Data Processing Symposium
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_Scopus_20260511
dc.subjectCounting; Defect detection; Image processing; Machine vision; PCB
dc.titleMachine vision based defect detection approach using image processing
dc.typeConference Object

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