The pinch-off effect and inhomogeneous barrier height analysis in Al/p-GaAs Schottky barrier diodes

dc.contributor.authorSoylu, M.
dc.contributor.authorYakuphanoğlu, Fahrettin
dc.contributor.authorFarooq, W. A.
dc.date.accessioned2026-08-12T17:03:36Z
dc.date.issued2011
dc.departmentFırat Üniversitesi
dc.description.abstractAl/p-GaAs Schottky barrier diodes (33 dots) were identically prepared. The effective barrier height values of one of the Al/p-GaAs Schottky barrier diodes were obtained as 0.681 and 0.945 eV from current voltage characteristics using the thermionic emission theory and capacitance voltage characteristics, respectively. The discrepancy between the barrier heights was explained in terms of barrier height inhomogeneity approach. It is seen that the Schottky barrier heights and ideality factors obtained from the I-V characteristics differ from diode to diode even if the samples are identically prepared. The origin of the barrier height inhomogeneity was analyzed by considering theoretical results obtained by Tung model. The obtained results indicate that the electron transport at the metal/semiconductor contacts are significantly affected by patches, but, the potential in front of small patches with low SBH surrounded by patches with high SBH is pinched off.
dc.description.sponsorshipKing Saud University [KSU-VPP-102]; Feyzi AKKAYA Scientific Activates Supporting Fund (FABED)
dc.description.sponsorshipThis work was supported by King Saud University under grant: KSU-VPP-102 and Feyzi AKKAYA Scientific Activates Supporting Fund (FABED). One of author wishes to thank KSU and FABED for young scientist grant.
dc.identifier.endpage142
dc.identifier.issn1842-6573
dc.identifier.issn2065-3824
dc.identifier.issue1.Şub
dc.identifier.scopus2-s2.0-79951823535
dc.identifier.scopusqualityQ4
dc.identifier.startpage135
dc.identifier.urihttps://hdl.handle.net/11508/48370
dc.identifier.volume5
dc.identifier.wosWOS:000288625000029
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherNatl Inst Optoelectronics
dc.relation.ispartofOptoelectronics and Advanced Materials-Rapid Communications
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260511
dc.subjectGaAs
dc.subjectSchottky diode
dc.subjectI-V and C-V measurements
dc.subjectBarrier inhomogeneities
dc.titleThe pinch-off effect and inhomogeneous barrier height analysis in Al/p-GaAs Schottky barrier diodes
dc.typeArticle

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