Electron Microscopy of Cracks in InxGa1-xAs/GaAs(001) Multi-Quantum Wells

dc.contributor.authorAtici, Y.
dc.contributor.authorYildiz, K.
dc.contributor.authorAkgul, U.
dc.date.accessioned2026-08-12T17:04:20Z
dc.date.issued2015
dc.departmentFırat Üniversitesi
dc.description.abstractWe studied cracks in two different InxGa1-xAs/GaAs(001) multi-quantum-well structures by electron microscopy. Transmission and scanning electron microscopy analyses of the sample-1 revealed that the epilayers associated with cracks. Detailed experimental works on the cracks were carried out by conventional and high-resolution electron microscopy. It was found that the epilayers were very effective on stopping the cracks in sample-1. Many dislocations were observed around the cracks and cracks tips. SEM images showed that the cracks formed an orthogonal set array accompanying with slits and pits. However, there were not observed any cracks in the sample-2.
dc.identifier.doi10.12693/APhysPolA.127.859
dc.identifier.endpage862
dc.identifier.issn0587-4246
dc.identifier.issn1898-794X
dc.identifier.issue3
dc.identifier.orcid0000-0002-3484-4653
dc.identifier.scopus2-s2.0-84928521542
dc.identifier.scopusqualityQ4
dc.identifier.startpage859
dc.identifier.urihttps://doi.org/10.12693/APhysPolA.127.859
dc.identifier.urihttps://hdl.handle.net/11508/48672
dc.identifier.volume127
dc.identifier.wosWOS:000353573400037
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherPolish Acad Sciences Inst Physics
dc.relation.ispartofActa Physica Polonica A
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/openAccess
dc.snmzKA_WoS_20260511
dc.subjectHeterostructures
dc.subjectGaas
dc.subjectDefects
dc.subjectStress
dc.subjectGrowth
dc.subjectFilms
dc.titleElectron Microscopy of Cracks in InxGa1-xAs/GaAs(001) Multi-Quantum Wells
dc.typeArticle

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