Infrared light sensing performance of CdO-doped TiO2 thin films

dc.contributor.authorIlhan, Mustafa
dc.contributor.authorGorunmez Gungor, Zohre
dc.contributor.authorKoc, Mumin Mehmet
dc.contributor.authorCoskun, Burhan
dc.contributor.authorYakuphanoğlu, Fahrettin
dc.date.accessioned2026-08-12T17:37:12Z
dc.date.issued2023
dc.departmentFırat Üniversitesi
dc.description.abstractCdO-based materials are often used in infrared (IR) sensing devices. Previously, IR sensing properties of different CdO-based materials were reported. In this study, we produced CdO-doped TiO2 films and assessed their IR sensing capabilities. TiO2 solutions and CdO-doped TiO2 solutions were manufactured using sol-gel synthesis. Doping the TiO2 solutions with CdO allows us to tune the optoelectronic and photodiode characteristics of thin films in composite form. Pure TiO2 and CdO-doped TiO2 nanocomposite thin films were fabricated by spin coating p-Si wafers with gel solutions; pure TiO2 gel solutions; and 1%, 2%, and 10% CdO-doped TiO2 gel solutions. In the evaluation of the infrared (IR) light sensing performance of the thin films, both I-V and I-tIR performances of Al/n-Si/Ti1-xO2CdxO/Al thin films were addressed. Using I-V and I-t data obtained from under dark and IR illuminations, various IR sensitivity-related characteristics such as barrier height, photoresponsivity, photosensitivity, LDR (Light Dependent Resistor) values, and so on were analysed. These results were then compared with previous studies assessing the IR and light sensitivity characteristics of different types of thin films.
dc.description.sponsorshipScientific Research Coordination Office of Kirklareli University [KLUBAP 209]
dc.description.sponsorshipAuthors, Zohre Gorunmez Gungor and Mumin Mehmet Koc, have received research support from the Scientific Research Coordination Office of Kirklareli University for project KLUBAP 209.
dc.identifier.doi10.1007/s10854-022-09411-2
dc.identifier.issn0957-4522
dc.identifier.issn1573-482X
dc.identifier.issue1
dc.identifier.orcid0000-0003-4500-0373
dc.identifier.orcid0000-0003-1122-5398
dc.identifier.scopus2-s2.0-85146659938
dc.identifier.scopusqualityQ2
dc.identifier.urihttps://doi.org/10.1007/s10854-022-09411-2
dc.identifier.urihttps://hdl.handle.net/11508/58232
dc.identifier.volume34
dc.identifier.wosWOS:000950642900007
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherSpringer
dc.relation.ispartofJournal of Materials Science-Materials in Electronics
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260511
dc.subjectOptical-Properties
dc.subjectPhotodiodes
dc.subjectParameters
dc.subjectLayer
dc.subjectSi
dc.titleInfrared light sensing performance of CdO-doped TiO2 thin films
dc.typeArticle

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