Machine Vision based Defect Detection Approach using Image Processing

dc.contributor.authorBaygin, Mehmet
dc.contributor.authorKarakose, Mehmet
dc.contributor.authorSarimaden, Alisan
dc.contributor.authorAkin, Erhan
dc.date.accessioned2026-08-12T16:58:49Z
dc.date.issued2017
dc.departmentFırat Üniversitesi
dc.description2017 International Artificial Intelligence and Data Processing Symposium (IDAP) -- SEP 16-17, 2017 -- Malatya, TURKEY
dc.description.abstractMachine vision systems are used in industrial production areas to produce products with fast, perfect and high precision. These systems allow users to make highly accurate and non-contact measurements and can detect deficiencies in the production process. In this work, a machine vision based non-contact defect detection algorithm for printed circuit boards (PCBs) has been developed. In this approach, which detects and controls the holes on the PCB, first a reference image is taken from the system and feature extraction process is applied to this image. In this real-time working approach, the reference image is matched with the incoming test images and the missing holes on the PCB are precisely detected. Furthermore, it has been determined that the error amount is less than 2 mu M in experimental studies. This approach, which works independently of color, position and direction, enables the defect detection process to be done very quickly and precisely.
dc.description.sponsorshipScientific and Technological Research Council of Turkey (SANTEZ Programme) (TUBITAK) [0743.STZ.2014, 112D021]
dc.description.sponsorshipThis study has been supported by The Scientific and Technological Research Council of Turkey (SANTEZ Programme) under Research Project No: 0743.STZ.2014 (TUBITAK Grant No: 112D021).
dc.description.sponsorshipIEEE Turkey Sect,Anatolian Sci
dc.identifier.isbn978-1-5386-1880-6
dc.identifier.orcid0000-0002-3276-3788
dc.identifier.orcid0000-0001-6449-8950
dc.identifier.orcid0000-0001-6476-9255
dc.identifier.orcid0000-0001-6476-9255
dc.identifier.urihttps://hdl.handle.net/11508/47051
dc.identifier.wosWOS:000426868700132
dc.identifier.wosqualityN/A
dc.indekslendigikaynakWeb of Science
dc.language.isoen
dc.publisherIeee
dc.relation.ispartof2017 International Artificial Intelligence and Data Processing Symposium (Idap)
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260511
dc.subjectMachine vision
dc.subjectimage processing
dc.subjectdefect detection
dc.subjectPCB
dc.subjectcounting
dc.titleMachine Vision based Defect Detection Approach using Image Processing
dc.typeConference Object

Dosyalar