Machine Vision based Defect Detection Approach using Image Processing
| dc.contributor.author | Baygin, Mehmet | |
| dc.contributor.author | Karakose, Mehmet | |
| dc.contributor.author | Sarimaden, Alisan | |
| dc.contributor.author | Akin, Erhan | |
| dc.date.accessioned | 2026-08-12T16:58:49Z | |
| dc.date.issued | 2017 | |
| dc.department | Fırat Üniversitesi | |
| dc.description | 2017 International Artificial Intelligence and Data Processing Symposium (IDAP) -- SEP 16-17, 2017 -- Malatya, TURKEY | |
| dc.description.abstract | Machine vision systems are used in industrial production areas to produce products with fast, perfect and high precision. These systems allow users to make highly accurate and non-contact measurements and can detect deficiencies in the production process. In this work, a machine vision based non-contact defect detection algorithm for printed circuit boards (PCBs) has been developed. In this approach, which detects and controls the holes on the PCB, first a reference image is taken from the system and feature extraction process is applied to this image. In this real-time working approach, the reference image is matched with the incoming test images and the missing holes on the PCB are precisely detected. Furthermore, it has been determined that the error amount is less than 2 mu M in experimental studies. This approach, which works independently of color, position and direction, enables the defect detection process to be done very quickly and precisely. | |
| dc.description.sponsorship | Scientific and Technological Research Council of Turkey (SANTEZ Programme) (TUBITAK) [0743.STZ.2014, 112D021] | |
| dc.description.sponsorship | This study has been supported by The Scientific and Technological Research Council of Turkey (SANTEZ Programme) under Research Project No: 0743.STZ.2014 (TUBITAK Grant No: 112D021). | |
| dc.description.sponsorship | IEEE Turkey Sect,Anatolian Sci | |
| dc.identifier.isbn | 978-1-5386-1880-6 | |
| dc.identifier.orcid | 0000-0002-3276-3788 | |
| dc.identifier.orcid | 0000-0001-6449-8950 | |
| dc.identifier.orcid | 0000-0001-6476-9255 | |
| dc.identifier.orcid | 0000-0001-6476-9255 | |
| dc.identifier.uri | https://hdl.handle.net/11508/47051 | |
| dc.identifier.wos | WOS:000426868700132 | |
| dc.identifier.wosquality | N/A | |
| dc.indekslendigikaynak | Web of Science | |
| dc.language.iso | en | |
| dc.publisher | Ieee | |
| dc.relation.ispartof | 2017 International Artificial Intelligence and Data Processing Symposium (Idap) | |
| dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | |
| dc.rights | info:eu-repo/semantics/closedAccess | |
| dc.snmz | KA_WoS_20260511 | |
| dc.subject | Machine vision | |
| dc.subject | image processing | |
| dc.subject | defect detection | |
| dc.subject | PCB | |
| dc.subject | counting | |
| dc.title | Machine Vision based Defect Detection Approach using Image Processing | |
| dc.type | Conference Object |







