Investigation of In0.5Ga0.5As/GaAs quantum dots

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dc.contributor.authorAtici, Y
dc.contributor.authorHovesepain, A
dc.contributor.authorCherns, D
dc.contributor.authorPolimeni, A
dc.contributor.authorHenini, M
dc.contributor.authorEaves, L
dc.date.accessioned2026-08-12T16:58:36Z
dc.date.issued1998
dc.departmentFırat Üniversitesi
dc.description14th International Congress on Electron Microscopy -- AUG 31-SEP 04, 1998 -- CANCUN, MEXICO
dc.description.abstract[Abstract Not Available]
dc.description.sponsorshipMexican Soc Microscopy,Consejo Nacl Ciencia & Tecnol,Inst Nacl Invest Nucl,Univ Autonoma Estado Mexico,Univ Veracruzana,Ctr Invest & Estudios Avanzados,Univ Nacl Autonoma Mexico,Ctr Invest Mat Avanzados,Inst Politecn Nacl,Univ Autonoma Nuevo Leon
dc.identifier.endpage434
dc.identifier.isbn0-7503-0566-5
dc.identifier.orcid0000-0001-9414-8492
dc.identifier.startpage433
dc.identifier.urihttps://hdl.handle.net/11508/46942
dc.identifier.wosWOS:000077020300209
dc.identifier.wosqualityN/A
dc.indekslendigikaynakWeb of Science
dc.language.isoen
dc.publisherIop Publishing Ltd
dc.relation.ispartofElectron Microscopy 1998, Vol 3: Materials Science 2
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260511
dc.titleInvestigation of In0.5Ga0.5As/GaAs quantum dots
dc.typeConference Object

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