Cd dopant effect on structural and optoelectronic properties of TiO2 solar detectors

dc.contributor.authorIlhan, Mustafa
dc.contributor.authorKoc, Mumin Mehmet
dc.contributor.authorCoskun, Burhan
dc.contributor.authorErkovan, Mustafa
dc.contributor.authorYakuphanoğlu, Fahrettin
dc.date.accessioned2026-08-12T17:35:47Z
dc.date.issued2021
dc.departmentFırat Üniversitesi
dc.description.abstractAl/n-Si/Ti1-xO2CdxO/Al photodiodes were produced using sol-gel and spin coating methods where CdO dopant was applied on different concentrations (x = 0.0; x = 0.01; x = 0.05; x = 0.10). Cd dopant effect upon structural, optical, photodiode and electrical properties was assessed. Scanning electron microscope and energy-dispersive spectra were used in the structural investigation. Optic properties were assessed using UV-Vis spectroscopy and bandgap energies of the photodiodes were calculated which were found to be between 3.25 and 3.36 eV. Increased bandgap energy was observed with increased CdO doping rate. Photodiode properties were assessed under varying daylight illuminations. Barrier height, ideality factor, dark current, linear dynamic rate, photosensitivity, photoresponsivity of the photodiodes were calculated. Electrical properties of the Al/n-Si/Ti1-xO2CdxO/Al photodiodes were calculated where conductance-voltage and capacitance-voltage plots were obtained. Corrective conductance-voltage and corrective capacitance-voltage graphs confirm that the electrical properties of the photodiodes depend on AC signal frequency. Frequency-dependent electrical characteristics were attributed to the density of interface states which were found to be between 10(11) and 10(12). Decreased density of interface state was found for increased AC signal frequency.
dc.identifier.doi10.1007/s10854-020-05000-3
dc.identifier.endpage2365
dc.identifier.issn0957-4522
dc.identifier.issn1573-482X
dc.identifier.issue2
dc.identifier.orcid0000-0003-4500-0373
dc.identifier.orcid0000-0002-4527-2056
dc.identifier.scopus2-s2.0-85098527192
dc.identifier.scopusqualityQ2
dc.identifier.startpage2346
dc.identifier.urihttps://doi.org/10.1007/s10854-020-05000-3
dc.identifier.urihttps://hdl.handle.net/11508/57667
dc.identifier.volume32
dc.identifier.wosWOS:000604333400040
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherSpringer
dc.relation.ispartofJournal of Materials Science-Materials in Electronics
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260511
dc.subjectThin-Film
dc.subjectOptical-Properties
dc.subjectElectrical Characterization
dc.subjectMicrostructure Properties
dc.subjectSilicon
dc.subjectPhotodiodes
dc.subjectDiode
dc.subjectGel
dc.subjectInterface
dc.subjectElectrode
dc.titleCd dopant effect on structural and optoelectronic properties of TiO2 solar detectors
dc.typeArticle

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