Controlling of conduction mechanism and electronic parameters of silicon-metal junction by mixed Methylene Blue/2?-7?-dichlorofluorescein

dc.contributor.authorSoylu, M.
dc.contributor.authorAl-Hartomy, Omar A.
dc.contributor.authorAl Said, Said A. Farha
dc.contributor.authorAl-Ghamdi, Ahmed A.
dc.contributor.authorYahia, I. S.
dc.contributor.authorYakuphanoğlu, Fahrettin
dc.date.accessioned2026-08-12T17:15:15Z
dc.date.issued2013
dc.departmentFırat Üniversitesi
dc.description.abstractAl/p-Si junction based on Organic Mixed Layer (OML) Methylene Blue (MB) and 2'-7'-dichlorofluorescein (DCF) was fabricated and the current voltage (I-V) and the capacitance voltage measurements of the structure have been obtained at room temperature. This combination resulted in both a good rectifying behavior and low leakage current. The characteristic parameters of the structure such as barrier height, ideality factor, interface states density and series resistance were determined from the electrical measurements. Also, Cheung functions and Norde method were used to evaluate the I-V characteristics and to obtain the characteristic parameters of the Schottky contact. High-low frequency capacitance voltage characteristics have been observed to have a maximum. The maximum value of the capacitance is decreased with increasing frequency. The higher values of capacitance at low frequencies were attributed to interface states and the excess capacitance resulting from the interface states in equilibrium with the Si that can follow the alternating current signal. The J-V curves in the reverse direction are taken and interpreted via both Schottky and Poole-Frenkel effects. Poole-Frenkel effect was found to be dominant in the reverse direction. (C) 2013 Elsevier Ltd. All rights reserved.
dc.description.sponsorshipTabuk University [S-0195-1434, S-0196-1434]
dc.description.sponsorshipThis study was supported by Tabuk University under project numbers:S-0195-1434 and S-0196-1434
dc.identifier.doi10.1016/j.microrel.2013.05.008
dc.identifier.endpage1906
dc.identifier.issn0026-2714
dc.identifier.issue12
dc.identifier.orcid0000-0002-5148-627X
dc.identifier.orcid0000-0002-5409-3770
dc.identifier.scopus2-s2.0-84888012169
dc.identifier.scopusqualityQ2
dc.identifier.startpage1901
dc.identifier.urihttps://doi.org/10.1016/j.microrel.2013.05.008
dc.identifier.urihttps://hdl.handle.net/11508/52144
dc.identifier.volume53
dc.identifier.wosWOS:000328667000012
dc.identifier.wosqualityQ3
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherPergamon-Elsevier Science Ltd
dc.relation.ispartofMicroelectronics Reliability
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260511
dc.subjectCurrent-Voltage
dc.subjectElectrical Characteristics
dc.subjectSemiconductor Contact
dc.subjectBarrier Height
dc.subjectPhotovoltaic Properties
dc.subjectSeries Resistance
dc.subjectInterface States
dc.subjectOrganic-Compound
dc.subjectSchottky Diodes
dc.subjectGaas Diode
dc.titleControlling of conduction mechanism and electronic parameters of silicon-metal junction by mixed Methylene Blue/2?-7?-dichlorofluorescein
dc.typeArticle

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