High-Throughput Dielectrophoretic Trapping and Detection of DNA Origami

dc.contributor.authorGhomian, Taher
dc.contributor.authorJeong, Hyunhak
dc.contributor.authorPan, Victor
dc.contributor.authorCelik, Kubra
dc.contributor.authorAlangari, Mashari
dc.contributor.authorKe, Yonggang
dc.contributor.authorHihath, Joshua
dc.date.accessioned2026-08-12T17:35:48Z
dc.date.issued2021
dc.departmentFırat Üniversitesi
dc.description.abstractAccurate control over the location of nanostructured materials for studying their electronic properties is important for the development of useful electronic devices. Dielectrophoresis is a unique method for trapping non-symmetric nanostructured materials between two electrodes in a specific direction. However, this method has traditionally suffered from a costly and slow fabrication process as well as low efficiency when trapping high-impedance nanomaterials. In this work, a dielectrophoretic device addressing the mentioned problems, is reported. First, a photolithography-based fabrication process achieves high throughput and low-cost devices with nanostructured contacts for attaching nanomaterials. Second, trapping of high-impedance nanomaterials is controlled using a scalable-electronic circuit that measures the capacitance variation at the trap location to identify when the nanomaterials of interest are attached to the electrode. As a primary target of interest, the trapping of 1D deoxyribonucleic acid (DNA) origamis is demonstrated. It is shown that a capacitance change in the range of 18% to 60% guarantees the presence of a single or a few DNA origamis in the trap location well-aligned with nanoelectrodes. Fluorescent, scanning electron microscopy, and atomic force microscopy images demonstrate the presence of DNA origamis in the trap location with the correct orientation.
dc.description.sponsorshipNSF/SRC SemiSynBio program [1807555/2836]
dc.description.sponsorshipAuthors recognize funding support from the NSF/SRC SemiSynBio program (1807555/2836).
dc.identifier.doi10.1002/admi.202001476
dc.identifier.issn2196-7350
dc.identifier.issue5
dc.identifier.orcid0000-0002-2949-9293
dc.identifier.orcid0000-0001-9474-5027
dc.identifier.orcid0000-0002-0878-7085
dc.identifier.orcid0000-0003-1673-2153
dc.identifier.scopus2-s2.0-85099445890
dc.identifier.scopusqualityQ1
dc.identifier.urihttps://doi.org/10.1002/admi.202001476
dc.identifier.urihttps://hdl.handle.net/11508/57682
dc.identifier.volume8
dc.identifier.wosWOS:000607732700001
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherWiley
dc.relation.ispartofAdvanced Materials Interfaces
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260511
dc.subjectdielectrophoresis
dc.subjectDNA origami
dc.subjectelectrical characterization
dc.subjectmolecular electronics
dc.subjectnanoelectrode fabrication
dc.titleHigh-Throughput Dielectrophoretic Trapping and Detection of DNA Origami
dc.typeArticle

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