LLM Based Software Test Scenario Generation System From Bug Descriptions

dc.contributor.authorGundem, Merve Yilmazer
dc.contributor.authorKarakose, Mehmet
dc.date.accessioned2026-08-12T16:08:46Z
dc.date.issued2026
dc.departmentFırat Üniversitesi
dc.description2026 30th International Conference on Information Technology, IT 2026 -- 24 February 2026 through 28 February 2026 -- Zabljak -- 221544
dc.description.abstractLarge, user-interactive software systems require extensive software testing for safe deployment. Manually generated test cases by software testers require extensive time and effort, and their scope remains limited. In this study, a system based on LLM is proposed for automatic test cases and test steps generation from bug descriptions. In the proposed system, bug descriptions were first collected from the Defects4J Dataset. Keywords relevant to the bug scope were extracted from the descriptions. Structured automatic prompts were generated from the extracted keywords. The generated prompts were fed into the LLM as input, and software test cases appropriate for the bugs were generated. The method was evaluated on actual bug descriptions by comparing it to a general (baseline) prompt. Experimental results show that the lengths of the generated scenarios are similar, but the proposed method increases the keyword match rate with error descriptions to an average of 89 %. The findings reveal that keyword-driven prompts are effective in generating more reliable and error-specific test scenarios without requiring additional data. © 2026 IEEE.
dc.identifier.doi10.1109/IT67293.2026.11435765
dc.identifier.isbn979-833159817-4
dc.identifier.scopus2-s2.0-105035994189
dc.identifier.scopusqualityN/A
dc.identifier.urihttps://doi.org/10.1109/IT67293.2026.11435765
dc.identifier.urihttps://hdl.handle.net/11508/41410
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.ispartof2026 30th International Conference on Information Technology, IT 2026
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_Scopus_20260511
dc.subjectAutomatic test pattern generation; Generation systems; Interactive software; Keyword-driven; Large users; Scenarios generation; Software testings; Software-systems; Test case; Test scenario; Software testing
dc.titleLLM Based Software Test Scenario Generation System From Bug Descriptions
dc.typeConference Object

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