Determination of the optical constants of Co(II) complex of Schiff base obtained from 1,8-diaminonaphthalene thin film by infrared spectra

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dc.contributor.authorYakuphanoğlu, Fahrettin
dc.contributor.authorSekerci, M
dc.date.accessioned2026-08-12T17:29:07Z
dc.date.issued2005
dc.departmentFırat Üniversitesi
dc.description.abstractDetermination of optical constants of metal complex thin film has been investigated by reflectance and transmittance spectra. The optical constants (refractive index n, extinction coefficient k, and dielectric constant epsilon) of the thin film were determined. The real part and imaginary parts of the complex dielectric constant were calculated. The refractive index dispersion obeyed the Cauchy model and Cauchy parameters were determined as A = 13.17, B = 9.37 X 10(-6) cm(2) and C = 1.58 X 10(-13) cm(4) at the range of 1700-4000 cm(-1). (c) 2005 Elsevier B.V. All rights reserved.
dc.identifier.doi10.1016/j.molstruc.2005.05.021
dc.identifier.endpage203
dc.identifier.issn0022-2860
dc.identifier.issn1872-8014
dc.identifier.issue1.Mar
dc.identifier.orcid0000-0002-7730-645X
dc.identifier.scopus2-s2.0-23944498644
dc.identifier.scopusqualityQ1
dc.identifier.startpage200
dc.identifier.urihttps://doi.org/10.1016/j.molstruc.2005.05.021
dc.identifier.urihttps://hdl.handle.net/11508/55562
dc.identifier.volume751
dc.identifier.wosWOS:000231844900028
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier
dc.relation.ispartofJournal of Molecular Structure
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260511
dc.subjectthin film
dc.subjectrefractive index dispersion
dc.subjectcomplex dielectric constant
dc.titleDetermination of the optical constants of Co(II) complex of Schiff base obtained from 1,8-diaminonaphthalene thin film by infrared spectra
dc.typeArticle

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