Detailed investigation of submicrometer-sized grains of chemically sprayed (Sn1-xAlx, O2) (0 ? x ? 0.085) thin films

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dc.contributor.authorBenhaliliba, M.
dc.contributor.authorBenouis, C. E.
dc.contributor.authorYakuphanoğlu, Fahrettin
dc.contributor.authorTiburcio-Silver, A.
dc.contributor.authorAydin, C.
dc.contributor.authorHamzaoui, S.
dc.contributor.authorMouffak, Z.
dc.date.accessioned2026-08-12T17:46:29Z
dc.date.issued2012
dc.departmentFırat Üniversitesi
dc.description.abstractIn this study, the submicrometer-sized grains of chemically sprayed tin oxide, SnO2, were largely investigated. The films (Sn1-xO2, Al-x), with x = 0-0.085 were grown by spray pyrolysis onto glass at a fixed temperature of 300 degrees C. Structural, optical, electrical and morphological properties were studied. These films are polycrystalline in nature with a tetragonal crystalline structure, and exhibited a preferred orientation along the (2 0 0) planes. Atomic force microscope (AFM) analysis demonstrated a nano-grain structure. Our nanostructured films revealed high transparency in the visible and infra-red spectra and an electrical resistivity that ranged from 1 to 1000 Omega cm. (C) 2012 Elsevier B.V. All rights reserved.
dc.description.sponsorshipagence nationale pour le developpement de la recherche universitaire (ANDRU) [8/U311/R77]; National Administration of Scientific Research (NASR); Algerian High Level Teaching and Scientific Research Ministry MESRS [CNEPRU2009-2012]; Oran Sciences and Technology University USTOMB
dc.description.sponsorshipThe work is included in the PNR project under contract number 8/U311/R77, supported by agence nationale pour le developpement de la recherche universitaire (ANDRU) http://www.andru.gov.dz, and National Administration of Scientific Research (NASR) http://www.nasr-dz.org. It is a part of CNEPRU2009-2012 supported by the Algerian High Level Teaching and Scientific Research Ministry MESRS and Oran Sciences and Technology University USTOMB. The authors gratefully acknowledge the generous assistance of Pr. M. Caglar for the X-rays analysis, Anadolu University Eskisehir, Turkey.
dc.identifier.doi10.1016/j.jallcom.2012.02.128
dc.identifier.endpage47
dc.identifier.issn0925-8388
dc.identifier.issn1873-4669
dc.identifier.orcid0000-0001-9997-6326
dc.identifier.scopus2-s2.0-84858988480
dc.identifier.scopusqualityQ1
dc.identifier.startpage40
dc.identifier.urihttps://doi.org/10.1016/j.jallcom.2012.02.128
dc.identifier.urihttps://hdl.handle.net/11508/61106
dc.identifier.volume527
dc.identifier.wosWOS:000302776600008
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier Science Sa
dc.relation.ispartofJournal of Alloys and Compounds
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260511
dc.subjectTin oxide
dc.subjectSpray pyrolysis
dc.subjectAl doping
dc.subjectPhysical properties
dc.subjectSubmicrometer structure
dc.subjectAFM
dc.titleDetailed investigation of submicrometer-sized grains of chemically sprayed (Sn1-xAlx, O2) (0 ? x ? 0.085) thin films
dc.typeArticle

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