Optical properties of nanostructure boron doped NiO thin films

dc.contributor.authorAydin, H.
dc.contributor.authorMansour, Sh. A.
dc.contributor.authorAydin, C.
dc.contributor.authorAl-Ghamdi, Ahmed A.
dc.contributor.authorAl-Hartomy, Omar A.
dc.contributor.authorEl-Tantawy, Farid
dc.contributor.authorYakuphanoğlu, Fahrettin
dc.date.accessioned2026-08-12T17:46:48Z
dc.date.issued2012
dc.departmentFırat Üniversitesi
dc.description.abstractBoron doped NiO films were prepared by sol-gel method. The effects of B content on the morphological and optical properties of NiO films were studied with atomic force microscopy, and optical characterization method. The average transmittance at the visible region is reached to 75 % for lower doped films (0.1 and 0.2 % B), whereas, the recorded average value of transmittance was about 62 % for doped film with 1 % B throughout the region. The optical energy gap value for pure NiO film was found to be 3.73 eV. These values were affected by B doping with non-monotonic variation and reached to 3.64 eV for 0.1 % B doped NiO. Also, the refractive index dispersion and dielectric constants of the NiO films were studied throughout the investigated range of wavelengths. The obtained results indicate that the optical parameters of the NiO film are controlled with boron doping.
dc.description.sponsorshipScientific and Technological Research Council of Turkey, (TUBITAK)-BIDEB; University of Tabuk [4/1433]
dc.description.sponsorshipOne of the authors (Sh.A. Mansour) is grateful to the Scientific and Technological Research Council of Turkey, (TUBITAK)-BIDEB for providing him a fellowship to work in Turkey via Research Fellowship Programme for Foreign Citizens. The present study is a result of an international collaboration program between University of Tabuk, Tabuk, Saudi Arabia, University of King Abdulaziz, Jeddah, Saudi Arabia and Firat University, Elazig, Turkey. The authors gratefully acknowledge the financial support from the University of Tabuk, Project number 4/1433.
dc.identifier.doi10.1007/s10971-012-2909-1
dc.identifier.endpage733
dc.identifier.issn0928-0707
dc.identifier.issn1573-4846
dc.identifier.issue3
dc.identifier.orcid0000-0001-9997-6326
dc.identifier.orcid0000-0002-0141-9773
dc.identifier.orcid0000-0002-5148-627X
dc.identifier.orcid0000-0002-5409-3770
dc.identifier.orcid0000-0001-9997-6326
dc.identifier.orcid0000-0003-3368-5811
dc.identifier.scopus2-s2.0-84876945237
dc.identifier.scopusqualityQ2
dc.identifier.startpage728
dc.identifier.urihttps://doi.org/10.1007/s10971-012-2909-1
dc.identifier.urihttps://hdl.handle.net/11508/61232
dc.identifier.volume64
dc.identifier.wosWOS:000312584900025
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherSpringer
dc.relation.ispartofJournal of Sol-Gel Science and Technology
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260511
dc.subjectNickel oxide
dc.subjectBoron
dc.subjectSol-gel
dc.subjectRefractive index
dc.titleOptical properties of nanostructure boron doped NiO thin films
dc.typeArticle

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