The effect of SiO2 dielectric layer on ultraviolet detecting properties of pentacene thin film transistor

dc.contributor.authorYakuphanoğlu, Fahrettin
dc.contributor.authorFarooq, W. Aslam
dc.date.accessioned2026-08-12T17:30:38Z
dc.date.issued2011
dc.departmentFırat Üniversitesi
dc.description.abstractThe pentacene thin film transistor was fabricated on a SiO2/Si substrate by thermal evaporated method at room temperature. Electrical characteristics of the pentacene transistor subjected to a UV light excitation at a wavelength of 365 nm were analyzed. A significant increase in the drain current of the pentacene thin film transistor under a UV excitation of 365 nm is observed with a maximum photosensitivity of 4.51 in the depletion regime. It is concluded that the pentacene thin film transistor can be used in UV photo-detecting devices. (C) 2010 Elsevier B.V. All rights reserved.
dc.description.sponsorshipKing Saud University [KSU-VPP-102]; Feyzi AKKAYA Scientific Activates Supporting Fund (FABED)
dc.description.sponsorshipThis work was supported by King Saud University under a grant number: KSU-VPP-102 and Feyzi AKKAYA Scientific Activates Supporting Fund (FABED). Author wishes to thank KSU and FABED for young Scientist grant.
dc.identifier.doi10.1016/j.synthmet.2010.11.008
dc.identifier.endpage135
dc.identifier.issn0379-6779
dc.identifier.issue1.Şub
dc.identifier.scopus2-s2.0-78650921516
dc.identifier.scopusqualityQ1
dc.identifier.startpage132
dc.identifier.urihttps://doi.org/10.1016/j.synthmet.2010.11.008
dc.identifier.urihttps://hdl.handle.net/11508/56162
dc.identifier.volume161
dc.identifier.wosWOS:000287383800019
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier Science Sa
dc.relation.ispartofSynthetic Metals
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260511
dc.subjectThin film transistor
dc.subjectPhotoresponse
dc.subjectField effect mobility
dc.titleThe effect of SiO2 dielectric layer on ultraviolet detecting properties of pentacene thin film transistor
dc.typeArticle

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